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Analysis of Standards-Based Counterfeit Microelectronics Detection Methods
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DOI：10.1109/ACCESS.2025.3526518.png)
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Abstract
En 中文
Counterfeiting of microelectronic parts is an ever-growing threat to the reliability and security of electronic systems. A study was conducted to investigate techniques for the detection of counterfeit microelectronic parts. Authentic, remarked, and cloned parts were included in the study. The data presented in this paper is the first collection of quantitative data on counterfeit testing, including the performance of individual test methods. Testing was performed by a test laboratory based on SAE AS6171 methods, and the reported results included qualitative observations and observed counterfeit defects. The study demonstrated that standards-based methods effectively detect remarked and cloned microelectronic parts. Cloned parts are of particular concern as more sophisticated versions contain fewer defects and are at risk of not being detected. Two of the cloned part numbers included in the study were found to have few counterfeit defects, all of which could be corrected by a counterfeiter to avoid detection. Insights into the performance of individual test methods based on the type of counterfeit are presented. These results contribute to the ongoing efforts to mitigate the risks from counterfeit microelectronics by continually improving testing standards and practices, such as the possible need to perform additional testing to ensure cloned parts are detected.
Keywords:
Testing
Microelectronics
Standards
Inspection
Scanning electron microscopy
Security
Counterfeiting
X-ray imaging
Supply chains
Visualization
Counterfeit detection
microelectronics
SAE AS6171
standards-based testing
supply chain security