.png){kind=icon}
.png){kind=icon}
Return
Analytical model for depth profiling using sonic IR NDE
.png){kind=icon}
PRE
AI
DOI：10.1016/j.ndteint.2018.07.008.png)
.png){kind=icon}
Original request for help.png){kind=icon}
Share.png){kind=icon}
Save
Abstract
En 中文
Sonic IR NDE is a relatively new hybrid NDE technology which has been proven to be reliable and sensitive to detect flaws of different types in a variety of materials and structures. Despite the success this technology has achieved in detecting defects, little work has been devoted to characterizing defects quantitatively. In this study, we present a model that describes heat diffusion from subsurface defects in a composite material using Green's function procedure. The model is used to map some aspects of the temperature-time curve with a defect's depth, namely, half maximum power temperature point, the peak slope point, and the second derivative peak point. The model suggests that a relationship can be established to map a defect's depth to these features. The diversity of features allows the user to choose the feature that fits best the application of interest.
Keywords:
Sonic IR
Depth profiling
Green's functions
AI Summary
Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.