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Application-driven multi-modal depth completion in fringe projection profilometry

delete2026-01-06
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OA
AI
B
Badrinath Balasubramaniam
V
Vignesh Suresh
Y
Yang Cheng
J
J. Li
B
Beiwen Li
DOI:10.1016/j.optlaseng.2025.109587delete
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Abstract

Abstract

En 中文
• A novel multi-modal depth completion network that merges sparse depth map computed from fringe projection, projector-illuminated grayscale image, and the relative depth map from the Depth Anything v2 Foundation Mode. • A unique metrology approach that addresses the long-standing challenges in fringe projection such as measuring mirror-like reflective surfaces and underexposed regions within a single scan. • A potentially transformative industrial sensing approach for complex and heterogeneous e-waste surfaces.
Keywords:
Fringe projection profilometry
Deep learning
Synthetic data
Robotic automation
Industrial metrology
Depth completion
Multi-modal model
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Journal

Optics and Lasers in Engineering cover
Optics and Lasers in Engineering
IF:
3.7
Papers:
7.2K
Citations:
1.7W

Organization

University of Wisconsin-Oshkosh cover
University of Wisconsin-Oshkosh
Scholars:
9
Papers: 5
Citations: 456
A
Alcon Research Laboratories
Scholars:
1
Papers: 1
Citations: 0
U
University of Georgia
Scholars:
1.5W
Papers: 1.2W
Citations: 2.9W
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