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Bayesian model inversion using stochastic spectral embedding

delete2021-07-01
delete12
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OA
AI
P
Paul‐Remo Wagner
S
Stefano Marelli *
B
Bruno Sudret
DOI:10.1016/j.jcp.2021.110141delete
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Abstract

Abstract

En 中文
In this paper we propose a new sampling-free approach to solve Bayesian model inversion problems that is an extension of the previously proposed spectral likelihood expansions (SLE) method. Our approach, called stochastic spectral likelihood embedding (SSLE), uses the recently presented stochastic spectral embedding (SSE) method for local spectral expansion refinement to approximate the likelihood function at the core of Bayesian inversion problems. We show that, similar to SLE, this approach results in analytical expressions for key statistics of the Bayesian posterior distribution, such as evidence, posterior moments and posterior marginals, by direct post-processing of the expansion coefficients. Because SSLE and SSE rely on the direct approximation of the likelihood function, they are in a way independent of the computational/mathematical complexity of the forward model. We further enhance the efficiency of SSLE by introducing a likelihood specific adaptive sample enrichment scheme. To showcase the performance of the proposed SSLE, we solve three problems that exhibit different kinds of complexity in the likelihood function: multimodality, high posterior concentration and high nominal dimensionality. We demonstrate how SSLE significantly improves on SLE, and present it as a promising alternative to existing inversion frameworks. (C) 2021 The Author(s). Published by Elsevier Inc. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
Keywords:
Bayesian model inversion
Inverse problems
Polynomial chaos expansions
Spectral likelihood expansions
Stochastic spectral likelihood embedding
Sampling-free inversion
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Journal

Journal of Computational Physics cover
Journal of Computational Physics
IF:
3.8
Papers:
1.5W
Citations:
7.4W

Organization

S
swiss federal institutes of technology domain
Scholars:
9.0W
Papers: 8.0W
Citations: 163