arrow
Return

Bayesian probability density evolution method for reliability analysis with stepwise uncertainty reduction

delete2026-06-20
delete0
delete
OA
AI
T
Tong Zhou
X
Xujia Zhu *
T
Tong Guo
H
Han Peng
J
Jize Zhang *
DOI:10.1016/j.ress.2026.112967delete
deleteOriginal
deleteShare
deleteSave
View PDF
Abstract

Abstract

En 中文
• An active learning function seeks to minimize the variance of failure probability. • Discrete importance sampling is devised for efficiently computing the learning function. • Multi-point enrichment is conducted via a stepwise maximization strategy. • Calibrated epistemic uncertainty resolves overestimation issues of upper-bounds.
Keywords:
Expected variance reduction
Probability density evolution method
Kriging
Discrete importance sampling
Reliability analysis
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

R
RELIABILITY ENGINEERING & SYSTEM SAFETY
IF:
11
Papers:
1.1K
Citations:
0

Organization

T
the hong kong university of science and technology
Scholars:
2.0K
Papers: 914
Citations: 0
U
Universite Paris-Saclay
Scholars:
1.4K
Papers: 443
Citations: 0
S
Southeast University
Scholars:
2.1W
Papers: 8.6K
Citations: 480
researcher View more organizations
Cited Papers

Cited Papers

Multi-point active learning probability density evolution method
err2025-07-08
err0
PREAI
errTong Zhou; Tong Guo; Xujia Zhu; Alexandros A. Taflanidis; Jize Zhang
errShare
errSave
Multi-point Bayesian active learning reliability analysis
err2025-05-01
err2
PREAI
errZhou, Tong; Zhu, Xujia; Guo, Tong; Dong, You; Beer, Michael
errShare
errSave
Fast Parallel Kriging-Based Stepwise Uncertainty Reduction With Application to the Identification of an Excursion Set
err2014-12-10
err0
errOAAI
errClément Chevalier; Julien Bect; David Ginsbourger; Emmanuel Vazquez; Victor Picheny; Yann Richet
errShare
errSave
Development of methods of structural reliability
err2025-03-01
err10
PREAI
errEllingwood, Bruce; Maes, Marc; Bartlett, F. Michael; Beck, Andre T.; Caprani, Colin; Kiureghian, Armen Der; Duenas-Osorio, Leonardo; Galvao, Neryvaldo; Gilbert, Robert; Li, Jie; Matos, Jose; Mori, Yasuhiro; Papaioannou, Iason; Parades, Roger; Straub, Daniel; Sudret, Bruno
errShare
errSave
Active learning for structural reliability: Survey, general framework and benchmark
err2022-05-01
err128
errOAAI
errMoustapha, Maliki; Marelli, Stefano; Sudret, Bruno
errShare
errSave
researcher View more