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Bending characteristics of anisotropic magnetoresistance effect in NiFeCu thin films on ultra-smooth polyimide substrates
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DOI:10.1016/j.physb.2026.418757.png)
Abstract
En 中文
• NiFeCu thin films on Xenomax with small surface roughness are successfully fabricated. • Large anisotropic magenetoresistance (AMR) ratio is observed in NiFeCu/Xenomax. • Bending-induced AMR behaviour can be categorized by magnetostriction constant of NiFeCu. • Bending-induced AMR effect can be explained by the inverse magnetostrictive effect. • Magnetic thin films on Xenomax can be a powerful tool for potential applications in magnetic sensors.
Keywords:
Anisotropic magnetoresistance
Magnetic thin films
Flexible electronics
Ultra-smooth polyimide substrates
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