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Binary Regression Models for Contaminated Data
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DOI：10.1111/j.2517-6161.1988.tb01723.x.png)
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Abstract
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SUMMARY
The nature of outliers in the context of binary regression data is discussed. Resistant fitting procedures produce estimated regression coefficients which are numerically larger than maximum likelihood, implying the need for a shrinkage-type correction. A simple model which allows for a small number of the binary responses being misrecorded is proposed, and associated techniques for robust estimation and diagnostics developed.
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