arrow
Return

Bootstrap unit root tests in panels with cross-sectional dependency

delete2004-06-01
delete216
delete
OA
AI
Y
Yoosoon Chang
DOI:10.1016/S0304-4076(03)00214-8delete
deleteOriginal
deleteShare
deleteSave
View PDF
Abstract

Abstract

En 中文
We apply bootstrap methodology to unit root tests for dependent panels with N cross-sectional units and T time series observations. More specifically, we let each panel be driven by a general linear process which may be different across cross-sectional units, and approximate it by a finite order autoregressive integrated process of order increasing with T. As we allow the dependency among the innovations generating the individual series, we construct our unit root tests from the estimation of the system of the entire N cross-sectional units. The limit distributions of the tests are derived by passing T to infinity, with N fixed. We then apply bootstrap method to the approximated autoregressions to obtain critical values for the panel unit root tests, and establish the asymptotic validity of such bootstrap panel unit root tests under general conditions. The proposed bootstrap tests are indeed quite general covering a wide class of panel models. They in particular allow for very general dynamic structures which may vary across individual units, and more importantly for the presence of arbitrary cross-sectional dependency. The finite sample performance of the bootstrap tests is examined via simulations, and compared to that of commonly used panel unit root tests. We find that our bootstrap tests perform relatively well, especially when N is small. (C) 2003 Elsevier B.V. All rights reserved.
Keywords:
panels with cross-sectional dependency
unit root tests
sieve bootstrap
AR approximation
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

Journal of Econometrics cover
Journal of Econometrics
IF:
4
Papers:
5.2K
Citations:
3.0W

Organization

No organization information available