.png){kind=icon}
.png){kind=icon}
Return
Brain Network Analysis and Recognition Algorithm for MDD Based on Class-Specific Correlation Feature Selection
.png){kind=icon}
OA
AI
DOI：10.3390/info16100912.png)
.png){kind=icon}
.png){kind=icon}
Share.png){kind=icon}
Save
Abstract
En 中文
Major Depressive Disorder (MDD) is a high-risk mental illness that severely affects individuals across all age groups. However, existing research lacks comprehensive analysis and utilization of brain topological features, making it challenging to reduce redundant connectivity while preserving depression-related biomarkers. This study proposes a brain network analysis and recognition algorithm based on class-specific correlation feature selection. Leveraging electroencephalogram monitoring as a more objective MDD detection tool, this study employs tensor sparse representation to reduce the dimensionality of functional brain network time-series data, extracting the most representative functional connectivity matrices. To mitigate the impact of redundant connections, a feature selection algorithm combining topologically aware maximum class-specific dynamic correlation and minimum redundancy is integrated, identifying an optimal feature subset that best distinguishes MDD patients from healthy controls. The selected features are then ranked by relevance and fed into a hybrid CNN-BiLSTM classifier. Experimental results demonstrate classification accuracies of 95.96% and 94.90% on the MODMA and PRED + CT datasets, respectively, significantly outperforming conventional methods. This study not only improves the accuracy of MDD identification but also enhances the clinical interpretability of feature selection results, offering novel perspectives for pathological MDD research and clinical diagnosis.
Keywords:
brain network
class-specific correlation
depression recognition
electroencephalogram (EEG)
feature selection
AI Summary
Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.