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Buffered Bounded Transparent Scan for Test Generation
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DOI：10.1109/ACCESS.2026.3706002.png)
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Abstract
En 中文
The reliability of high performance processors depends on the ability to detect defects that occur in electronic chips during manufacturing and during in-field operation. One of the bottlenecks for comprehensive testing is the volume of test data and test application time needed for detecting faults from advanced fault models. These parameters can be reduced by using multicycle scan-based tests. A conventional multicycle scan-based test has several functional capture cycles between a scan in and a scan out operation. These clock cycles can be used for increasing the number of faults a test detects, thus contributing to test compaction. In a bounded transparent scan test, the clock cycles between the scan operations can form an arbitrary sequence of functional capture and scan shift cycles. This flexibility supports test compaction beyond that possible with conventional multicycle scan-based tests. The new contribution of this article is based on the observation that scan shift cycles between the scan operations of a test can form buffers that partition the test into two or more parts. Each part has its own subset of faults that are detected before or during the buffer. This creates a special case of bounded transparent scan referred to as buffered bounded transparent scan, or BBTS. With a buffer between subsets of detected faults, BBTS simplifies test generation. The article describes the first test generation procedure for BBTS tests and presents experimental results for two-cycle gate-exhaustive faults in benchmark circuits to demonstrate its effectiveness.
Keywords:
Bounded transparent scan tests
multicycle scan-based tests
test compaction
test generation
two-cycle gate-exhaustive faults