arrow
Return

Cellogram: On-the-Fly Traction Force Microscopy

delete2019-09-20
delete21
delete
OA
AI
T
Tobias Lendenmann
T
Teseo Schneider
J
Jérémie Dumas
M
Marco Tarini
C
Costanza Giampietro
A
Apratim Bajpai
W
Weiqiang Chen
J
Julia Gerber
D
Dimos Poulikakos
A
Aldo Ferrari *
D
Daniele Panozzo *
DOI:10.1021/acs.nanolett.9b01505delete
deleteOriginal
deleteShare
deleteSave
View PDF
Abstract

Abstract

En 中文
Traction force microscopy (TFM) derives maps of cell-generated forces, typically in the nanonewton range, transmitted to the extracellular environment upon actuation of complex biological processes. In traditional approaches, force rendering requires a terminal, time-consuming step of cell deadhesion to obtain a reference image. A conceptually opposite approach is provided by reference-free methods, opening to the on-the-fly generation of force maps from an ongoing experiment. This requires an image processing algorithm keeping the pace of the biological phenomena under investigation. Here, we introduce an integrated software pipeline rendering force maps from single reference-free TFM images seconds to minutes after their acquisition. The algorithm tackles image processing, reference image estimation, and finite element analysis as a single problem, yielding a robust and fully automatic solution. The method's capabilities are demonstrated in two applications. First, the mechanical annihilation of cancer cells is monitored as a function of rising environmental temperature, setting a population threshold at 45 degrees C. Second, the fast temporal correlation of forces produced across individual cells is used to map physically connected adhesion points, yielding typical lengths that vary as a function of the cell cycle phase.
Keywords:
Real time analysis
reference free
focal adhesion
stress fibers
traction force microscopy
cTFM
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

Nano Letters cover
Nano Letters
IF:
9.1
Papers:
2.7W
Citations:
16.5W

Organization

N
New York University
Scholars:
4.4W
Papers: 3.9W
Citations: 5.8W
S
swiss federal institutes of technology domain
Scholars:
9.0W
Papers: 8.0W
Citations: 163
U
University of Milan
Scholars:
5.1W
Papers: 3.9W
Citations: 5.0W
researcher View more organizations