.png){kind=icon}
Return
Challenges in testing core-based system ICs
.png){kind=icon}
PRE
AI
DOI：10.1109/35.769283.png)
.png){kind=icon}
Original request for help.png){kind=icon}
Share.png){kind=icon}
Save
Abstract
En 中文
Advances in semiconductor design and manufacturing technology enable the design of complete systems on one IC. To develop these system ICs in a timely manner, traditional IC design in which everything is designed from scratch, is replaced by a design style based on embedding large reusable modules, the so-called cores. Effectively, the design of a core-based IC is partitioned over the core provider(s) and the system-chip integrator. The development of tests should follow the same partitioning. In this article we describe the differences between traditional and core-based test development, and present an overview of current industrial approaches. We list the future challenges regarding standardization, tool development, and academic and industrial research.
Keywords:
TEST ACCESS
CHIPS
AI Summary
Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.
Journal
IF:
8.2
Papers:
6.9K
Citations:
2.2W
Organization
No organization information available
Cited Papers
.png){kind=icon}
ShareSaveShareSaveShareSave
ShareSaveShareSaveShareSave
no more
no more