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Challenges in testing core-based system ICs

delete1999-06-01
delete44
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Erik Jan Marinissen
DOI：10.1109/35.769283delete
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Abstract

Abstract

En 中文
Advances in semiconductor design and manufacturing technology enable the design of complete systems on one IC. To develop these system ICs in a timely manner, traditional IC design in which everything is designed from scratch, is replaced by a design style based on embedding large reusable modules, the so-called cores. Effectively, the design of a core-based IC is partitioned over the core provider(s) and the system-chip integrator. The development of tests should follow the same partitioning. In this article we describe the differences between traditional and core-based test development, and present an overview of current industrial approaches. We list the future challenges regarding standardization, tool development, and academic and industrial research.
Keywords:
TEST ACCESS
CHIPS
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Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

IEEE Communications Magazine cover
IEEE Communications Magazine
IF:
8.2
Papers:
6.9K
Citations:
2.2W

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