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Chip-scale atomic wave-meter enabled by machine learning
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DOI：10.1126/sciadv.abn3391.png)
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Abstract
En 中文
The quest for miniaturized optical wave-meters and spectrometers has accelerated the design of novel approaches in the field. Particularly, random spectrometers (RS) using the one-to-one correlation between the wavelength and an output random interference pattern emerged as a promising tool combining high spectral resolution and cost-effectiveness. Recently, a chip-scale platform for RS has been demonstrated with a markedly reduced footprint. Yet, despite the evident advantages of such modalities, they are very susceptible to environmental fluctuations and require an external calibration process. To address these challenges, we demonstrate a paradigm shift in the field, enabled by the integration of atomic vapor with a photonic chip and the use of a machine learning classification algorithm. Our approach provides a random wave-meter on chip device with accurate calibration and enhanced robustness against environmental fluctuations. The demonstrated device is expected to pave the way toward fully integrated spectrometers advancing the field of silicon photonics.
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