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Combinational Logic Analysis Using Laser Voltage Probing
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DOI：10.31399/asm.cp.istfa2015p0035.png)
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Abstract
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Abstract
Laser Voltage Probing (LVP) using continuous-wave near infra-red lasers are popular for failure analysis, design and test debug. LVP waveforms provide information on the logic state of the circuitry. This paper aims to explain the waveforms observed from combinational circuitries and use it to rebuild the truth table.
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