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Communication: Neutral atom imaging using a pulsed electromagnetic lens
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DOI：10.1063/1.4976986.png)
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Abstract
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We report on progress towards a neutral atom imaging device that will be used for chemically sensitive surface microscopy and nanofabrication. Our novel technique for improving refractive power and correcting chromatic aberration in atom lenses is based on a fundamental paradigm shift from continuous-beam focusing to a pulsed, three-dimensional approach. Simulations of this system suggest that it will pave the way toward the long-sought goal of true atom imaging on the nanoscale. Using a prototype lens with a supersonic beam of metastable neon, we have imaged complex patterns with lower distortion and higher resolution than has been shown in any previous experiment. Comparison with simulations corroborates the underlying theory and encourages further refinement of the process. Published by AIP Publishing.
Keywords:
BEAM
LITHOGRAPHY
OPTICS
LIGHT
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