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Compressive single-pixel snapshot x-ray diffraction imaging
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DOI：10.1364/OL.39.000111.png)
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Abstract
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We present a method for realizing snapshot, depth-resolved material identification using only a single, energy-sensitive pixel. To achieve this result, we employ a coded aperture with subpixel features to modulate the energy spectrum of coherently scattered photons and recover the object properties using an iterative inversion algorithm based on compressed sensing theory. We demonstrate high-fidelity object estimation at x-ray wavelengths for a variety of compression ratios exceeding unity. (C) 2013 Optical Society of America
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