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Concurrent control chart patterns recognition with singular spectrum analysis and support vector machine
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DOI：10.1016/j.cie.2012.10.009.png)
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Abstract
En 中文
Since abnormal control chart patterns (CCPs) are indicators of production processes being out-of-control, it is a critical task to recognize these patterns effectively based on process measurements. Most methods on CCP recognition assume that the process data only suffers from single type of unnatural pattern. In reality, the observed process data could be the combination of several basic patterns, which leads to severe performance degradations in these methods. To address this problem, some independent component analysis (ICA) based schemes have been proposed. However, some limitations are observed in these algorithms, such as lacking of the capability of monitoring univariate processes with only one key measurement, misclassifications caused by the inherent permutation and scaling ambiguities, and inconsistent solution. This paper proposes a novel hybrid approach based on singular spectrum analysis (SSA) and support vector machine (SVM) to identify concurrent CCPs. In the proposed method, the observed data is first separated by SSA into multiple basic components, and then these separated components are classified by SVM for pattern recognition. The scheme is suitable for univariate concurrent CCPs identification, and the results are stable since it does not have shortcomings found in the ICA-based schemes. Furthermore, it has good generalization performance of dealing with the small samples. Superior performance of the proposed algorithm is achieved in simulations. (C) 2012 Elsevier Ltd. All rights reserved.
Keywords:
Control charts
Concurrent patterns
Singular spectrum analysis
Support vector machine
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6.5
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1.0W
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3.8W
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