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Counting wheat heads using a simulation model

delete2025-01-01
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PRE
AI
T
Tianyou Jiang
J
Jiming Hu
S
Song, Zuojie
王
王永真 (Yongzhen Wang)
X
Xu Liu
Z
Ziyu Zhou
T
Tang, Zhongzhen
Y
Yan Zhao
Z
Zuo, Changzhen
X
Xia Geng
孔令让 cover
孔令让 (Lingrang Kong) *
DOI:10.1016/j.compag.2024.109633delete
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Abstract

Abstract

En 中文
Numerous studies have reported a significant positive correlation between wheat yield and the quantity of wheat heads. However, collecting data on wheat heads in the field poses a challenge for several reasons, including the uncontrollable nature of the environment, inconsistent data quality, and ambiguous data truth. To address these challenges, we developed a simulation strategy to replicate the conditions of a real wheat field, which enabled the data collection process to be conducted indoors over a short period. After applying grayscale image processing to process the simulated wheat images, we trained and tested nine deep learning models: Faster-RCNN, YOLOv7, YOLOv8, CenterNet, SSD, RetinaNet, EfficientDet, Deformable-DETR and DINO. Our results indicated that YOLOv7 performed the best (R2 = 0.963, RMSE = 2.463). We then compared our model trained on simulated wheat data to a model trained on real wheat data (R2 = 0.963 vs 0.972, RMSE = 2.463 vs 2.692). We also achieved good model performance on five test sets: GWHD, SDAU2021-SDAU2024. The results demonstrated the efficacy of our simulation, which provides an efficient and convenient strategy for the precision agriculture community.
Keywords:
Wheat head counting
Simulation
Deep learning
Object detection

Journal

Computers and Electronics in Agriculture cover
Computers and Electronics in Agriculture
IF:
8.9
Papers:
1.0W
Citations:
4.8W

Organization

S
Shandong Agricultural University
Scholars:
1.5W
Papers: 7.7K
Citations: 8
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