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CT-IoT: a combinatorial testing-based path selection framework for effective IoT testing
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AI
DOI：10.1007/s10664-021-10017-1.png)
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Abstract
En 中文
Testing Internet of Things (IoT) systems is challenging. This is not only because of the various aspects of IoT systems, such as software, hardware, and network that need to be tested, but also because of the unexpected issues caused by a large number of heterogeneous devices brought together by IoT systems. When an IoT system has hundreds, or even thousands, of heterogeneous devices, which devices should be tested to detect more faults? How can we systematically test an IoT system and its numerous devices in a cost-effective way? Are there any coverage criteria for testers to evaluate the thoroughness of the testing against IoT systems? In this paper, we present a combinatorial testing path selection framework for IoT systems, called CT-IoT, that systematically identifies and recommends testing paths in IoT systems for effective testing. We also propose four coverage criteria that can help testers evaluate the testing thoroughness for IoT systems. We conducted an empirical study of CT-IoT on two real-world IoT systems and evaluated the effectiveness of CT-IoT in terms of coverage achievements. The results show the superiority of CT-IoT over a random approach.
Keywords:
Internet of things
IoT testing
Combinatorial testing
Test case generation
Coverage criteria
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