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Deep Learning-Based Multi-Species Appearance Defect Detection Model for MLCC

delete2024-01-01
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PRE
AI
M
Minjie Du
M
Meiyun Chen *
X
Xiuhua Cao
K
Kiyoshi Takamasu
DOI:10.1109/TIM.2024.3375957delete
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Abstract

Abstract

En 中文
The appearance of defects in a multilayer ceramic capacitor (MLCC) adversely affects its performance and reliability. Thus, detecting these defects during MLCC production is imperative. However, this task faces numerous challenges, such as significant variations in the shape and size of defects, indistinct defect boundaries, and the inefficiency of manual detection methods. To address these issues, this article proposes the RSE-YOLO model for identifying, localizing, and classifying defects in MLCC images. We design a novel backbone structure, namely the residual coordinate weighted convolutional network (RCWCNet), which possesses enhanced feature information extraction capabilities for accurately locating defect areas. Additionally, we introduce the space attention pyramid pooling module (SAPPM) to achieve a weighted fusion of local and global feature information. Furthermore, the ECA-PAN is employed as the model's neck structure to facilitate the fusion of feature information at different scales, improving the model's generalization ability in multiscale defect detection. Experimental results demonstrate that the RSE-YOLO model exhibits excellent performance on the MLCC dataset, achieving an mAP50 of 93.9%, mAP50-95 of 63.2%, F1 of 90.9%, and a frame rate of 57 FPS, meeting the requirements for the task of MLCC appearance defect detection.
Keywords:
Feature extraction
Defect detection
Location awareness
Convolutional neural networks
YOLO
Shape
Data mining
Feature information extraction
feature information fusion
MLCC appearance defect detection

Journal

IEEE Transactions on Instrumentation and Measurement cover
IEEE Transactions on Instrumentation and Measurement
IF:
5.9
Papers:
1.9W
Citations:
5.8W

Organization

U
University of Tokyo
Scholars:
7.1W
Papers: 6.5W
Citations: 2.2K
G
guangdong university of technology
Scholars:
2.9W
Papers: 2.0W
Citations: 36