arrow
Return

Defect detection oriented lifecycle modeling in complex product development

delete2004-08-01
delete16
PRE
AI
J
Jan van Moll
J
Jef Jacobs
R
RJ Rob Kusters
J
J.J.M. Trienekens
DOI:10.1016/j.infsof.2003.12.001delete
deleteOriginal
deleteOriginal request for help
deleteShare
deleteSave
Abstract

Abstract

En 中文
As the complexity of today's products increases, single projects, single departments or even single companies can no longer develop total products, resulting in concurrent and distributed development. To manage the resulting organizational complexity, projects need a lifecycle that explicitly reflects the concurrent and distributed nature of the project context. This paper addresses the essence of lifecycle modeling, with emphasis on defect detection. An adequately modeled lifecycle allows the localization and recognition of defect-sensitive areas in complex product development. A case study involving real-life development projects indicates that transitions between constituent subprojects are in particular defect-sensitive. A second case study shows that by a defect detection-driven construction of a project-specific lifecycle, fewer residual defects can be expected. (C) 2003 Elsevier B.V. All rights reserved.
Keywords:
lifecycle modeling
V-model
defect prevention
defect detection
distributed development
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

Information and Software Technology cover
Information and Software Technology
IF:
4.3
Papers:
3.8K
Citations:
7.7K

Organization

No organization information available
Cited Papers

Cited Papers

Surviving global software development
err2001-01-01
err185
PREAI
errEbert, C; De Neve, P
errShare
errSave
Leveraging resources in global software development
err2001-01-01
err137
PREAI
errBattin, RD; Crocker, R; Kreidler, J; Subramanian, K
errShare
errSave
Global software development
err2001-01-01
err554
PREAI
errHerbsleb, JD; Moitra, D
errShare
errSave