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Deformation state extraction from electron backscatter diffraction patterns via simulation-based pattern-matching
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DOI：10.1016/j.scriptamat.2020.09.004.png)
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Abstract
En 中文
A new simulation-based pattern-matching method is developed to retrieve the deformation tensor from electron backscatter diffraction patterns. Minimizing the least-squares difference between a target pattern and simulated deformed patterns, the deformation state of the target pattern can be inferred with an average absolute error of similar to 10(-8 )for the distortion tensor under ideal conditions. The new approach is robust against significant pattern rotation compared to the cross-correlation based method. Additionally, the pattern center can be simultaneously optimized with an average absolute distortion tensor error of similar to 10(-4) for noise-free patterns. (C) 2020 Acta Materialia Inc. Published by Elsevier Ltd.
Keywords:
Plastic deformation
Electron backscatter diffraction (EBSD)
Simulation
Dislocation
Deformation state extraction
Pattern-matching
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