arrow
Return

Dependence patterns for modeling simultaneous events

delete2016-10-01
delete7
PRE
AI
J
Joanna Rodríguez *
L
Lino, Rosa E.
P
Pepa Ramírez‐Cobo
DOI:10.1016/j.ress.2016.05.008delete
deleteOriginal
deleteOriginal request for help
deleteShare
deleteSave
Abstract

Abstract

En 中文
In this paper we examine in detail some of the modeling capabilities of the stationary m-state BMAP, with simultaneous events up to size k, noted BMAP(m)(k). Specifically, we study the forms of the auto correlation functions of the inter-event times and event sizes. We provide a novel characterization of the functions which is suitable for analyzing the dependence patterns. In particular, this allows one to prove a geometrically decrease to zero of the functions and to identify four correlation patterns, when m=2. The case m >= 3 is illustrated via an extensive simulation study, from which it can be deduced that, as expected, richer structures can be obtained as m increases. In addition, the influence of the dependence patterns for both auto-correlation functions for the BMAP(2) (2) in the counting process has been explored through an empirical analysis. (C) 2016 Elsevier Ltd. All rights reserved.
Keywords:
Batch Markovian arrival process (BMAP)
Dependent inter-event times
Dependent event arrivals size
Autocorrelation function
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

R
Reliability Engineering and System Safety
IF:
11
Papers:
9.0K
Citations:
4.2W

Organization

U
Universidad Carlos III de Madrid
Scholars:
5.5K
Papers: 5.7K
Citations: 4.5K
U
universidad de cadiz
Scholars:
7.2K
Papers: 5.8K
Citations: 7