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Dependent binary relevance models for multi-label classification

delete2014-03-01
delete134
PRE
AI
E
Elena Montañés
R
Robin Senge
J
José Barranquero Tolosa
J
José Ramón Quevedo
J
Juan José del Coz *
E
Eyke Hüllermeier
DOI:10.1016/j.patcog.2013.09.029delete
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Abstract

Abstract

En 中文
Several meta-learning techniques for multi-label classification (MLC), such as chaining and stacking, have already been proposed in the literature, mostly aimed at improving predictive accuracy through the exploitation of label dependencies. In this paper, we propose another technique of that kind, called dependent binary relevance (DBR) learning. DBR combines properties of both, chaining and stacking. We provide a careful analysis of the relationship between these and other techniques, specifically focusing on the underlying dependency structure and the type of training data used for model construction. Moreover, we offer an extensive empirical evaluation, in which we compare different techniques on MLC benchmark data. Our experiments provide evidence for the good performance of DBR in terms of several evaluation measures that are commonly used in MLC. (C) 2013 Elsevier Ltd. All rights reserved.
Keywords:
Multi-label classification
Label dependence
Stacking
Chaining
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Journal

Pattern Recognition cover
Pattern Recognition
IF:
7.6
Papers:
1.3W
Citations:
4.5W

Organization

P
Philipps University Marburg
Scholars:
1.3W
Papers: 1.0W
Citations: 10
U
University of Oviedo
Scholars:
1.1W
Papers: 1.0W
Citations: 15