Return
Dependent binary relevance models for multi-label classification
DOI:10.1016/j.patcog.2013.09.029.png)
Abstract
En 中文
Several meta-learning techniques for multi-label classification (MLC), such as chaining and stacking, have already been proposed in the literature, mostly aimed at improving predictive accuracy through the exploitation of label dependencies. In this paper, we propose another technique of that kind, called dependent binary relevance (DBR) learning. DBR combines properties of both, chaining and stacking. We provide a careful analysis of the relationship between these and other techniques, specifically focusing on the underlying dependency structure and the type of training data used for model construction. Moreover, we offer an extensive empirical evaluation, in which we compare different techniques on MLC benchmark data. Our experiments provide evidence for the good performance of DBR in terms of several evaluation measures that are commonly used in MLC. (C) 2013 Elsevier Ltd. All rights reserved.
Keywords:
Multi-label classification
Label dependence
Stacking
Chaining
AI Summary
Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.
Journal
IF:
7.6
Papers:
1.3W
Citations:
4.5W

