Detecting work-function differences in scanning tunneling microscopy

doi:10.1063/1.123980

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Detecting work-function differences in scanning tunneling microscopy

1999-05-17

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DOI：10.1063/1.123980

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Abstract

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Variations of the work-function differences between tip and sample over distance have been investigated by a special procedure with a scanning tunneling microscope. This procedure allows the measurement of displacement current I-c dependencies on the voltage U. For a Pt tip on a Au surface and for a W tip on a Pt surface, work-function differences among 0, 2 and 0, 6 eV were found. They increase with increasing distance. From the slope of the I-c (U) characteristics in different distances, the diameter of the tip is estimated. (C) 1999 American Institute of Physics. [S0003-6951(99)04220-5].

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PROBE FORCE MICROSCOPY

KELVIN PROBE

SEMICONDUCTOR-DEVICES

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