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Developing a skip-lot sampling scheme by variables inspection using repetitive sampling as a reference plan
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DOI：10.1080/00207543.2021.1909768.png)
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Abstract
En 中文
In today's manufacturing environment, the rate of defective products has been continuously decreasing; thus, variables sampling plans with process capability indices (PCIs) have been recommended to gather more information about a manufacturing process and reduce required sample sizes for inspection. In particular, skip-lot sampling plan (SkSP) is suitable for a series of lots having stable and excellent product quality. Moreover, the concept of repetitive group sampling (RGS), which can allow the use of less samples to maintain desired protection to producers and consumers, is especially appropriate where inspection or testing is costly or destructive. This study, by incorporating the advantages of PCIs, SkSP, and RGS, constructs a variables SkSP with RGS as the reference plan (called SkSP-RGS) based on one-sided PCIs for products with a unilateral specification limit. The proposed plan reduces the sample size while achieving a similar discriminatory power, compared with a conventional variables single sampling plan (SSP), a RGS plan (RGSP), and a SkSP of type 2 (SkSP-2). Tables of plan parameters are provided for frequently applied quality and risk requirements so that practitioners can easily apply the proposed plan.
Keywords:
Acceptance sampling plan
process capability indices
operating characteristic curve
average sample number
fraction of nonconformities
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