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Diffeomorphisms groups and pattern matching in image analysis
DOI:10.1023/A:1008001603737.png)
Abstract
En 中文
In a previous paper, it was proposed to see the deformations of a common pattern as the action of an infinite dimensional group. We show in this paper that this approach can be applied numerically for pattern matching in image analysis of digital images. Using Lie group ideas, we construct a distance between deformations defined through a metric given the cost of infinitesimal deformations. Then we propose a numerical scheme to solve a variational problem involving this distance and leading to a sub-optimal gradient pattern matching. Its links with fluid models are established.
Keywords:
pattern matching
diffeomorphisms group
Lie group
deformations
physically based models
geodesic distance
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