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DNA at conductive interfaces: What can atomic force microscopy offer?
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DOI：10.1016/j.jelechem.2023.117448.png)
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Abstract
En 中文
This review is devoted to the analysis of the capabilities of atomic force microscopy (AFM) in the study of the behavior of DNA at conducting solid-liquid and solid-air interfaces under electrochemical control and after the influence of the potential differences. The first part of the review presents the main aspects of AFM, the phys-ical and chemical properties of DNA, and the behavior of DNA at conductive interfaces under the action of an electric field. The second part highlights the main categories of AFM applicability for DNA analysis at conduct-ing interfaces from the point of view of electrical stimulus-structure, process-structure, and process -struc-ture-electrochemical properties correlation. The applicability of AFM's main capabilities is shown: (i) visualization (of both monolayers and single molecules and hybridization complexes of DNA on a conductive surface), (ii) single-molecule force spectroscopy under electrochemical control, (iii) manipulation of DNA posi-tion at the nanoscale level. This review can be a starting point for further multidisciplinary DNA studies at elec-trochemical interfaces.
Keywords:
Deoxyribonucleic acid
Electrode
electrolyte interface
Electrochemical sensors
Atomic force microscopy
Heterogeneity
Nanoscale
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