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Does microstructure matter for statistical nanoindentation techniques?
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DOI：10.1016/j.cemconcomp.2009.08.007.png)
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Abstract
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In their paper, Trtik et al. (2009) identify spurious peaks in the application of statistical nanoindentation technique as a critical obstacle for mechanical phase identification. In this discussion. we show that Trtik et al.'s finding is a consequence of an unrealistic virtual 3-D checkerboard microstructure considered by the authors. These peaks are not a general feature of indentation on multiphase materials, nor can the presence of such peaks be attributed to an intrinsic shortcoming of the grid-indentation technique. We also show that the authors' assertion of the absence of homogeneous material regions extending beyond 3 pm in cementitious materials is groundless. (C) 2009 Elsevier Ltd. All rights reserved.
Keywords:
Nanoindentation
Statistical analysis
Microstructure
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