Electron Microscopy Through Large-Language Model Control2026-07-270 OA AI CChristopher S Dunham JJudy Su YYueyun Chen NNathan Joshua KKhanh Tran RRachel Hansen AAva Duvall KKhang Tran JJungyoun Cho JJames Done PPeter Ercius MMatthew Mecklenburg * DOI:10.1093/mam/ozag053.980OriginalOriginal request for helpShareSaveAbstract En