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Element Specific Monolayer Depth Profiling

delete2014-08-08
delete63
PRE
AI
S
S. Macke
A
Abdullah Radi
J
J. E. Hamann-Borrero
A
A. Verna
M
Martin Bluschke
B
Brueck, Sebastian
E
E. Goering
R
Ronny Sutarto
F
Feizhou He
G
G. Cristiani
M
Meng Wu
E
E. Benckiser
H
H.‐U. Habermeier
Г
Г. Логвенов
N
Nicolas Gauquelin
G
Gianluigi A. Botton
A
Adam P. Kajdos
S
Susanne Stemmer
G
G. A. Sawatzky
M
M. W. Haverkort
B
B. Keimer
V
V. Hinkov *
DOI：10.1002/adma.201402028delete
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Abstract

Abstract

En
Keywords:
thin film heterostructures
complex functional materials
resonant X-ray reflectivity
non-destructive characterization
depth profiling
AI Summary

AI Summary

Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.

Journal

Advanced Materials cover
Advanced Materials
IF:
26.8
Papers:
3.4W
Citations:
46.0W

Organization

U
University of California Santa Barbara
Scholars:
1.2W
Papers: 9.6K
Citations: 3.6W
University of California System cover
University of California System
Scholars:
37.5W
Papers: 33.7W
Citations: 6.6K
U
University of Saskatchewan
Scholars:
1.5W
Papers: 1.4W
Citations: 1.7W
M
Max Planck Society
Scholars:
8.2W
Papers: 7.7W
Citations: 3.3W
M
McMaster University
Scholars:
3.6W
Papers: 3.3W
Citations: 4.4W
U
University of British Columbia
Scholars:
6.9W
Papers: 6.1W
Citations: 8.6W
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