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Enhanced Quantitative Wavefront Imaging for Nano-Object Characterization
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DOI：10.1021/acsnano.4c05152.png)
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Abstract
En 中文
Quantitative phase imaging enables precise and label-free characterizations of individual nano-objects within a large volume, without a priori knowledge of the sample or imaging system. While emerging common path implementations are simple enough to promise a broad dissemination, their phase sensitivity still falls short of precisely estimating the mass or polarizability of vesicles, viruses, or nanoparticles in single-shot acquisitions. In this paper, we revisit the Zernike filtering concept, originally crafted for intensity-only detectors, with the aim of adapting it to wavefront imaging. We demonstrate, through numerical simulation and experiments based on high-resolution wavefront sensing, that a simple Fourier-plane add-on can significantly enhance phase sensitivity for subdiffraction objects & horbar;achieving over an order of magnitude increase (x12)& horbar;while allowing the quantitative retrieval of both intensity and phase. This advancement allows for more precise nano-object detection and metrology.
Keywords:
quantitative phase imaging
sensitivity increase
nanoparticles
scattering contrast
singlenano-object metrology
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