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Exception Coverage on Automotive Processors

delete2026-02-01
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PRE
AI
S
S. Roy *
N
Nikhil Jain
N
Neha Srivastava
R
Ravinder Dasila
P
Prokash Ghosh
A
Ajay Sharma
A
Anjum, Afshan
J
J.W. Scott
DOI:10.1109/LES.2025.3571040delete
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Abstract

Abstract

En 中文
With the advent of modular and independent zonal processing in Software-Defined-Vehicles (SDV), the processor in an automotive system is expected to handle complex exception scenarios elegantly. This letter addresses the need for comprehensive exception coverage during the verification of the automotive processor. Unlike prior research focusing on only two simultaneous exceptions, our work extends to all combinations of simultaneous exceptions. The proposed methodology involves the systematic grouping of exceptions into subcategories based on similarity while maintaining priority, followed by targeted coverage assessment for each group. A two-pass simulation technique is used to drive multiple external events like interrupts in the second pass to create high-activity time windows with simultaneous exceptions. This hierarchical approach allows for the creation of a manageable and effective exception list, facilitating thorough verification without overwhelming computational resources. Applied to a 32-bit RISC-V processor, our methodology shows a large improvement of 7X in efficiency compared to traditional methods, highlighting its advantage in enhancing safety and trustworthiness of automotive systems. This work takes a major step toward the verification of all combinations of simultaneous exceptions in processors.
Keywords:
Program processors
Automotive engineering
Software
Random sequences
Safety
Error correction codes
Training
Pipelines
Logic
Data mining
Automotive processor
exception coverage
processor verification
software-defined-vehicles

Journal

IEEE Embedded Systems Letters cover
IEEE Embedded Systems Letters
IF:
2
Papers:
101
Citations:
696

Organization

N
nxp semiconductors
Scholars:
408
Papers: 275
Citations: 0
I
indian institute of technology system (iit system)
Scholars:
9.5W
Papers: 9.9W
Citations: 93