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Explainable machine learning models for defects detection in industrial processes
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AI
DOI：10.1016/j.cie.2024.110214.png)
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Abstract
En 中文
Machine learning algorithms in non-linear pattern recognition for defect detection in manufacturing processes are increasingly prevalent in the context of Industry 4.0. This scenario enables factories to develop methodologies for monitoring and controlling the quality of their products, obtaining better operational efficiency indicators, and offering increasingly competitive products in the market. Explainable Artificial Intelligence can facilitate understanding how the models make decisions and assist in tracking anomaly points. This paper proposes an explainability framework for machine learning models in defect detection. This work applied the multinational industry's approach to the tire manufacturing process. Models such as random forest, gradient boosting decision tree, light gradient boosting machine, logistic regression, support vector machine, and multilayer perceptron were considered to evaluate the performance of tires in compliance with production standards. Statistical methodologies had to be adopted to deal with the small number of samples training the machine learning models. The random forest and logistic regression models achieved the best performances with an accuracy of 92% and 96%, respectively. The Local Interpretable Model -Agnostic Explanations and SHapley Additive exPlanations methods were used to identify the relevant process variables. The approach presents the global and local interpretations of the results, allowing for a deeper understanding of how process variables discriminate the fault. The proposed framework determines reference values for each selected process variable for tire manufacturing in compliance with quality standards. This approach provides a relevant tool for quality control management in tire manufacturing industries.
Keywords:
Explainable artificial intelligence
Machine learning
Defect detection
Tire manufacturing
Optimization
Journal
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