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Fast Electrical Impedance Tomography Based on Code-Division-Multiplexing Using Orthogonal Codes

delete2015-05-01
delete16
PRE
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M
Martin Gevers *
P
Patrik Gebhardt
S
Stephan Westerdick
M
Michael Vogt
T
Thomas Musch
DOI:10.1109/TIM.2015.2410310delete
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Abstract

Abstract

En 中文
Electrical impedance tomography (EIT) is used to determine the spatial conductivity distribution of a measurement environment that involves several applications in the areas of process engineering and medical diagnostics. In common EIT systems, the measurements are performed by means of current patterns which are injected into the measurement environment using a serial time-division-multiplexing (TDM) scheme for the excitation of different electrodes. The measurement rate can be increased by performing parallel excitation using orthogonal signals. In this paper, a code-division-multiplexing (CDM) measurement procedure is presented. To optimize the separation between different measurement channels and the dynamic range, orthogonal Walsh-Hadamard codes are used. The measurements are conducted with a fast EIT system with nine parallel excitation sources and 18 parallel measurement channels. The measured crosstalk rejection between different channels is larger than 98 dB. The maximum absolute deviation between different measurement sets for repeated measurements is less than 24 mu V with a mean standard deviation of less than 8.2 mu V. The dynamic range for impedance measurements based on different excitation procedures (TDM, frequency-division-multiplexing, and CDM) has been determined. Furthermore, reconstructed conductivity distributions based on measurements with the different excitation procedures have been compared with each other for different measurement scenarios (a root mean square difference of less than 1.2%). Finally, the influences of frequency-dependent measurement objects on the excitation procedures have been discussed.
Keywords:
Code-division-multiplexing (CDM)
codes
electrical impedance tomography (EIT)
frequency-division-multiplexing (FDM)
tomography
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Journal

IEEE Transactions on Instrumentation and Measurement cover
IEEE Transactions on Instrumentation and Measurement
IF:
5.9
Papers:
2.0W
Citations:
5.8W

Organization

R
ruhr university bochum
Scholars:
2.3W
Papers: 1.9W
Citations: 14
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