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Field-enhanced scanning optical microscope

delete2000-05-01
delete18
PRE
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A
Andrea V. Bragas *
O
Oscar E. Martínez
DOI:10.1364/OL.25.000631delete
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Abstract

Abstract

En 中文
We present experimental results of an imaging technique that uses as a local probe the optical field enhanced at the junction of a scanning tunneling microscope illuminated by a p-polarized laser beam. Images of highly oriented pyrolithic graphite, recorded at a constant height mode, show a lateral optical resolution of as much as 10 nm. Approach curves exhibit sensitivity on a subnanometer scale of the optical signal to the tip-sample distance, yielding the ultrahigh vertical resolution reached in the images. (C) 2000 Optical Society of America.
Keywords:
METALLIC PROBE TIP
MODE
SPECTROSCOPY
RESOLUTION
IMAGES
FIBER
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Journal

Optics Letters cover
Optics Letters
IF:
3.3
Papers:
4.0W
Citations:
7.6W

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