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Fly-scan ptychography
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DOI：10.1038/srep09074.png)
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Abstract
En 中文
We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. This approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.
Keywords:
K-B MIRRORS
COMPUTED-TOMOGRAPHY
PHASE-RETRIEVAL
RAY
DIFFRACTION
RESOLUTION
MICROSCOPY
OPTIMIZATION
EIGER
BEAM
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