Functional test generation based on word-level SAT

Zhihong Zeng

doi:10.1016/j.sysarc.2004.10.006

Functional test generation based on word-level SAT

2005-08-01

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DOI：10.1016/j.sysarc.2004.10.006

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Functional test generation coupled with symbolic simulation offers a good compromise between formal verification and numerical simulation for design validation. The generation of functional test vectors guided by miscellaneous coverage metrics can be posed as a satisfiability problem (SAT). While a number of efficient Boolean SAT engines have been developed for gate level designs, they are not directly applicable to behavioral and RTL designs containing significant arithmetic components. This paper presents two approaches that enhance the capability of functional test generation by preserving arithmetic operators in the design. They are based on word-level SAT techniques: (1) LPSAT, based on integer linear programming, and (2) CLP-SAT, based on constraint logic programming. The proposed SAT solvers allow to efficiently handle the designs with mixed word-level arithmetic operators and bit-level logic gates. The experimental results are quite encouraging compared to traditional CNF-based and BDD-based SAT solvers. The paper also suggests a method to build an integrated SAT solving framework where different SAT solvers work together to provide a more complete solution to functional test generation and other verification applications. (c) 2005 Elsevier B.V. All rights reserved.

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Functional test generation based on word-level SAT

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