Fundamental parameter based quantification algorithm for confocal nano-X-ray fluorescence analysis

Tom Schoonjans

doi:10.1016/j.sab.2011.12.006

Fundamental parameter based quantification algorithm for confocal nano-X-ray fluorescence analysis

2012-01-01

42

PRE

AI

DOI：10.1016/j.sab.2011.12.006

Original

Original request for help

Save

Abstract

En 中文

A new method for the quantification of X-ray fluorescence (XRF) was derived based on the fundamental parameter method (FPM). The FPM equations were adapted to accommodate the special case of confocal nano-XRF, i.e. X-ray nano-beam excitation coupled with confocal detection, taking into account the special characteristics of the detector channel polycapillary. A thorough error estimation algorithm based on the Monte Carlo method was applied, producing a detailed analysis of the uncertainties of the quantification results. The new FPM algorithm was applied on confocal nano-XRF data obtained from cometary dust returned by NASA's Stardust mission, recorded at beamline ID13 of the European Synchrotron Radiation Facility. (C) 2011 Elsevier B.V. All rights reserved.

Keywords:

X-ray fluorescence

Quantification

Confocal

Fundamental parameter method

Fundamental parameter based quantification algorithm for confocal nano-X-ray fluorescence analysis

Abstract

Journal

Organization