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FunDEMentals of Error-Shaping DEM DACs [Feature]

delete2026-05-19
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PRE
AI
E
Enrique Alvarez-Fontecilla
P
Paul S. Wilkins
DOI:10.1109/mcas.2026.3665189delete
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Abstract

Abstract

En 中文
DEM plays a key role in many systems such as high-performance <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\Delta \Sigma $ </tex-math></inline-formula> ADCs and high-resolution Nyquist data converters. By randomizing DAC element selection, DEM transforms nonlinearity into noise, and in oversampled systems, it may additionally shape the noise’s spectrum to push its energy out of band. This tutorial paper focuses on error-shaping DEM. We review the basics, explain what shaped spectra means, and present practical errorshaping DEM encoder designs.
Keywords:
Analog-to-digital converter (ADC)
delta-sigma ( $\Delta \Sigma $ )
digital-to-analog converter (DAC)
dynamic element matching (DEM)
error-shaping
power spectral density (PSD)
randomization
scrambling
shuffling

Journal

IEEE Circuits and Systems Magazine cover
IEEE Circuits and Systems Magazine
IF:
3.5
Papers:
525
Citations:
1.3K

Organization

A
analog devices inc.
Scholars:
11
Papers: 6
Citations: 0