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Global context guided refinement and aggregation network for lightweight surface defect detection
DOI:10.1016/j.patcog.2025.112893.png)
Abstract
En 中文
• A fast and accurate pixel-level surface defect detection network with global guidance is proposed. • A Depthwise Self-Attention is proposed to learn global information with low computation cost. • A Channel Cross-Attention is proposed to help suppress the background interference from low-level features. • The advantages of the proposed approach over existing methods are analyzed.
Journal
IF:
7.6
Papers:
1.3W
Citations:
4.5W

