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Global context guided refinement and aggregation network for lightweight surface defect detection

delete2025-12-10
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PRE
AI
F
Feng Yan
姜晓恒 cover
姜晓恒 (Xiaoheng Jiang)
Y
Yang Lu
L
Lisha Cui
J
Jiale Cao
M
Mingliang Xu
DOI:10.1016/j.patcog.2025.112893delete
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Abstract

Abstract

En 中文
• A fast and accurate pixel-level surface defect detection network with global guidance is proposed. • A Depthwise Self-Attention is proposed to learn global information with low computation cost. • A Channel Cross-Attention is proposed to help suppress the background interference from low-level features. • The advantages of the proposed approach over existing methods are analyzed.

Journal

Pattern Recognition cover
Pattern Recognition
IF:
7.6
Papers:
1.3W
Citations:
4.5W

Organization

S
School of Computer and Artificial Intelligence
Scholars:
169
Papers: 58
Citations: 0
S
School of Electrical and Information Engineering
Scholars:
261
Papers: 103
Citations: 0