Global emissivity correction algorithm based on ECPT full process response

doi:10.1016/j.measurement.2025.119258

Global emissivity correction algorithm based on ECPT full process response

2025-10-14

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DOI：10.1016/j.measurement.2025.119258

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• A global ECPT-based algorithm corrects emissivity due to surface roughness. • The correction algorithm improves temperature accuracy by over 93%. • Defect depth is linearly quantified with accuracy over 98% after correction.

Global emissivity correction algorithm based on ECPT full process response

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