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Guided Wave-Based Defect Localization via Parameterized FRF-Based Reduced-Order Models

delete2024-09-01
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PRE
AI
P
Paul Sieber
K
Konstantinos Agathos
R
Rohan Soman
W
Wiesław Ostachowicz
E
Eleni Chatzi *
DOI:10.1061/JENMDT.EMENG-7766delete
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Abstract

Abstract

En 中文
The use of Lamb waves within a guided wave (GW)-based scheme holds promise toward monitoring and nondestructive evaluation (NDE) of plate structures. Their short wavelength enables interaction with small defects and they can travel long distances, thus offering extensive spatial coverage. In boosting the performance of these schemes for more advanced damage identification tasks, such as precise damage localization and quantification, the fusion of measurement data with models is advantageous. Such a hybrid scheme, which relies on the inclusion of engineering models, is hampered by the short wavelengths of GW-based schemes. Short wavelengths require a fine discretization of numerical models in space and in time, which results in high computational costs. In alleviating this issue, we propose a reduced-order model (ROM) relying on exploitation of the frequency response function (FRF) principle, which is parameterized with respect to the positioning of local defects. Through appropriate coordinate transformations, the surrogate, constructed based on the matching pursuit (MP) algorithm, can exploit the mechanical properties of the wave so that only a small amount of training simulations are needed. The efficacy of the proposed surrogate is demonstrated in a synthetic inverse setting, using a particle swarm optimization (PSO) strategy.
Keywords:
SPECTRAL ELEMENT METHOD
COMPOSITE STRUCTURES
DAMAGE LOCALIZATION
MATCHING PURSUITS
LAMB WAVES
FINITE
PROPAGATION
IDENTIFICATION
FLAWS
SUM

Journal

Engineering Fracture Mechanics cover
Engineering Fracture Mechanics
IF:
5.3
Papers:
4.7K
Citations:
3.2W

Organization

P
Polish Academy of Sciences
Scholars:
3.0W
Papers: 3.1W
Citations: 3.1W
E
ETH Zurich
Scholars:
3.0W
Papers: 2.4W
Citations: 8.4W
U
University of Exeter
Scholars:
2.0W
Papers: 2.1W
Citations: 3.6W
S
swiss federal institutes of technology domain
Scholars:
9.0W
Papers: 8.0W
Citations: 163
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