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High electron mobility InN

delete2007-04-17
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OA
AI
R
R.E. Jones *
X
Xue Li
E
E. E. Haller
H
H. C. M. van Genuchten
K
K. M. Yu
J
Joel W. Ager
Z
Z. Liliental‐Weber
W
W. Walukiewicz
路海 (Hai Lu)
W
W. J. Schaff
DOI:10.1063/1.2722693delete
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Abstract

Abstract

En 中文
Irradiation of InN films with 2 MeV He+ ions followed by thermal annealing below 500 degrees C creates films with high electron concentrations and mobilities, as well as strong photoluminescence. Calculations show that electron mobility in irradiated samples is limited by triply charged donor defects. Subsequent thermal annealing removes a fraction of the defects, decreasing the electron concentration. There is a large increase in electron mobility upon annealing; the mobilities approach those of the as-grown films, which have 10 to 100 times smaller electron concentrations. Spatial ordering of the triply charged defects is suggested to cause the unusual increase in electron mobility.
Keywords:
SEMICONDUCTORS
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Journal

Applied Physics Letters cover
Applied Physics Letters
IF:
3.6
Papers:
10.4W
Citations:
17.8W

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