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High-precision phase measurement for interferometric imaging based on reference source and optical filtering
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DOI：10.1117/1.OE.65.4.044102.png)
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Abstract
En 中文
Interferometric imaging provides an indirect synthetic-aperture approach for achieving high-resolution imaging in incoherent scenarios, offering substantial potential for compact and lightweight system architectures. The primary challenge lies in accurately determining the phase, which is physically encoded in the displacement between the interference extremum and the zero optical path difference (OPD) position, and is highly susceptible to perturbations from instrumental noise and path-length fluctuations. To address this issue, this article proposes a high-precision and robust phase-measurement method for interferometric imaging by injecting a reference source into the entire interference optical path and subsequently separating it from the signal beam through optical filtering. In combination with a statistical averaging strategy based on symmetric extrema, the method suppresses random phase fluctuations and reduces measurement error without requiring precise OPD control. Experimental results demonstrate a phase-measurement error below 0.02 pi. When applied to an interferometric imaging system, the proposed method enables reliable reconstruction of two complementary bright-dark target scenes corresponding to a 50 mu m displacement of the object. Owing to its robustness, accuracy, and ease of integration, the proposed approach offers a practical route toward high-resolution interferometric imaging.
Keywords:
phase measurement
optical signal processing
optical interferometry
remote sensing
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178
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