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Imaging interferometric microscopy
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DOI：10.1364/OL.28.001424.png)
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Abstract
En 中文
We introduce and demonstrate a new microscopy concept: imaging interferometric microscopy (IIM), which is related to holography, synthetic-aperture imaging, and off-axis-dark-field illumination techniques. IIM is a wavelength-division multiplex approach to image formation that combines multiple images covering different spatial-frequency regions to form a composite image with a resolution much greater than that permitted by the same optical system using conventional techniques. This new type of microscopy involves both off-axis coherent illumination and reinjection of appropriate zero-order reference beams. Images demonstrate high resolution, comparable with that of a high-numerical-aperture (NA) objective, while they retain the long working distance, the large depth of field, and the large field of view of a low-NA objective. A Fourier-optics model of IIM is in good agreement with the experiment. (C) 2003 Optical Society of America.
Keywords:
FLUORESCENCE MICROSCOPY
RESOLUTION
LITHOGRAPHY
Journal
IF:
3.3
Papers:
4.0W
Citations:
7.6W
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