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Improved Free-Space Calibration Technique for Precise Measurement of THz Complex Permittivity
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DOI：10.1109/LAWP.2026.3656172.png)
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Abstract
En 中文
The accuracy of free-space complex permittivity measurements relies heavily on system calibration. However, existing calibration techniques often rely on high-precision system hardware or complex calibration procedures, which limit their universality and operational convenience in practical measurement scenarios. This issue is particularly pronounced in the terahertz (THz) band, severely compromising measurement reliability. This letter presents a free-space calibration technique tailored for the THz band. Based on the 12-term error model, we propose a novel short-open-load-delay calibration method. This method enables measurement without requiring any antenna or system movement for extracting the complex permittivity using multilayer inversion algorithms. Experimental results demonstrate that the proposed method yields superior accuracy in the 325 GHz to 500 GHz range compared to conventional calibration techniques such as through-reflect-line and through-reflect-match. This work presents a robust solution for accurately and rapidly characterizing dielectric properties at the THz band, particularly suited for application scenarios with demanding requirements on measurement stability and repeatability.
Keywords:
Complex permittivity
free-space method
short-open-load-delay (SOLD) calibration
THz band
without any movement
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4.8
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1.0W
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2.8W
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