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Intact-film orthogonal 2D X-ray diffraction mapping for crystallographic homogeneity evaluation in perovskite solar modules

delete2026-07-23
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PRE
AI
D
Dongshin Kim
J
Jaehwi Lee
D
Dongmin Lee
E
Eun Young Park
J
Jeongmin Son
J
Jongdeuk Seo
W
Woojin Lee
H
Hyungsu Jang
C
Chang Hyeon Yoon
M
M Kim
Y
Yu Jin Shin
M
Min Jung Sung
N
Nam Joong Jeon
J
Jin Young Kim *
Y
Yun Seop Shin *
T
Tae Joo Shin *
D
Dong Suk Kim *
DOI：10.1016/j.joule.2026.102594delete
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Abstract

Abstract

En 中文
• A 2D X-ray diffraction mapping technique enables intact-film structural analysis • Mapping spatially resolves crystallinity, crystal orientation, and residual strain • Large-area structural homogeneity enables 23.0% PCE over 86.4 cm2 perovskite modules • This study elucidates the underlying mechanisms of two distinct spin-coating methods

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Joule cover
Joule
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35.4
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UNIST
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ulsan national institute of science and technology
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