.png){kind=icon}
.png){kind=icon}
Return
Interferometer-Based Microwave Microscopy Operating in Transmission Mode
.png){kind=icon}
PRE
AI
DOI：10.1109/JSEN.2014.2317452.png)
.png){kind=icon}
Original request for help.png){kind=icon}
Share.png){kind=icon}
Save
Abstract
En 中文
A microwave near-field sensing technique with sub-wavelength resolution is proposed for nondestructive local characterization of materials. The method is based on the measurement of a transmission coefficient by means of an association of a vector network analyzer, a hybrid coupler, an evanescent microwave coaxial probe, and an impedance tuner built up with a high precision programmable delay line and a variable motor-driven attenuator. Simplicity of operation and tuning possibility of the measurement sensitivity in the presence of the material under investigation are competitive advantages of the method. The depth and lateral resolutions of the microscope are experimentally verified.
Keywords:
Near-field microwave microscopy
evanescent probe
high impedance
interferometry
local characterization
AI Summary
Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.