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Interferometric phase-dispersion microscopy
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DOI：10.1364/OL.25.001526.png)
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Abstract
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We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples. (C) 2000 Optical Society of America OCIS codes: 040.2840, 110.0180, 110.4500, 120.5050, 170.3880.
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OPTICAL COHERENCE TOMOGRAPHY
TURBID MEDIUM
CONTRAST
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3.3
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4.0W
Citations:
7.6W
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